Microprocessor Built-in Self-test
Microprocessor Built-In Self-Test is a diagnostic methodology embedded within a microprocessor that enables the processor to autonomously execute predefined test routines to detect and isolate internal faults without requiring external testing equipment.
354
Publications
11.6K
Citations
853
Authors
223
Institutions
Publications per year
2017–2026
18
Variants
Microprocessor Bist
Parents
354
Microprocessor Software-Based Self-Testing
Mihalis Psarakis, Dimitris Gizopoulos, Ernesto Sánchez et al. · IEEE Design & Test of Computers · 2010 · 256 citations
1–5 of 354
853
17
h-index
National and Kapodistrian University of Athens, Greece
24 publications · 1.2K citations
17
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15
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13
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11
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1–5 of 853
223

University of Piraeus
Piraeus, Greece
16 h-index
45 publications
2.3K citations

National and Kapodistrian University of Athens
Athens, Greece
15 h-index
42 publications
1.7K citations
IBM (United States)
Armonk, United States
13 h-index
52 publications
1.5K citations
Politecnico di Torino
Turin, Italy
12 h-index
56 publications
2K citations
Intel (United States)
Santa Clara, United States
10 h-index
20 publications
1.1K citations
Motorola (United States)
Schaumburg, United States
8 h-index
31 publications
921 citations
University of Michigan
Ann Arbor, United States
8 h-index
26 publications
593 citations
Princeton University
Princeton, United States
8 h-index
13 publications
420 citations
1–8 of 223
23 publications · 1.2K citations
16
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15 publications · 770 citations
13
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13 publications · 395 citations
12
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12 publications · 631 citations
11
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8 publications · 269 citations
8
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1–5