Microprocessor Built-in Self-test

Microprocessor Built-In Self-Test is a diagnostic methodology embedded within a microprocessor that enables the processor to autonomously execute predefined test routines to detect and isolate internal faults without requiring external testing equipment.

354

Publications

11.6K

Citations

853

Authors

223

Institutions

Publications per year

2017–2026

18

Variants

Microprocessor Bist

Authors

853

  1. AP
    A. Paschalis

    National and Kapodistrian University of Athens, Greece

    25 publications · 1K citations

    17

    h-index

  2. DG
    Dimitris Gizopoulos

    National and Kapodistrian University of Athens, Greece

    24 publications · 1.2K citations

    17

    h-index

  3. YZ
    Y. Zorian

    Cirrus Logic (United States), United States

    15 publications · 525 citations

    15

    h-index

  4. NK
    N. Kranitis

    National and Kapodistrian University of Athens, Greece

    15 publications · 620 citations

    13

    h-index

  5. MS
    M. Sonza Reorda

    Politecnico di Torino, Italy

    11 publications · 576 citations

    11

    h-index

1–5 of 853

Venues

  1. 16

    h-index

  2. IEEE Transactions on Computers

    15 publications · 770 citations

    13

    h-index

  3. 12

    h-index

  4. IEEE Design & Test of Computers

    12 publications · 631 citations

    11

    h-index

  5. IEEE Journal of Solid-State Circuits

    8 publications · 269 citations

    8

    h-index

1–5