Proceedings of the IEEE · 1998 · 115 citations · 66 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyDigital Integrated Circuit DesignIntegrated Circuit DesignLow-power Digital Circuit DesignMemory DevicesCmos Digital Circuit DesignCmos Logic CircuitsComplementary Metal-oxide-semiconductor DevicesDigital Logic CircuitsSilicon-on-insulator CmosSilicon-on-insulator TechnologyStatic Random-access MemoryVery-large-scale Integration
This paper reviews the recent advances of silicon-on-insulator (SOI) technology for complementary metal-oxide-semiconductor (CMOS) very-large-scale-integration memory and logic applications. Static random access memories (SRAMs), dynamic random access memories (DRAMs), and digital CMOS logic circuits are considered. Particular emphases are placed on the design issues and advantages resulting from the unique SOI device structure. The impact of floating-body in partially depleted devices on the circuit operation, stability, and functionality are addressed. The use of smart-body contact to improve the power and delay performance is discussed, as are global design issues.
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A 200-MHz 64-b dual-issue CMOS microprocessor
D. Dobberpuhl, Richard T. Witek, R. Allmon et al. · IEEE Journal of Solid-State Circuits · 1992 · 392 citations
Engineering, Computer Engineering, Electrical Engineering +17
Measurement and modeling of self-heating in SOI nMOSFET's
L.T. Su, J.E. Chung, D.A. Antoniadis et al. · IEEE Transactions on Electron Devices · 1994 · 331 citations
The design and analysis of VLSI circuits
G.W.A.D. · Microelectronics Reliability · 1986 · 219 citations
Engineering, Computer Engineering, Electrical Engineering +12