L.T. Su

Full copper wiring in a sub-0.25 μm CMOS ULSI technology

D. Edelstein, J. Heidenreich, R. Goldblatt et al. · 2002 · 352 citations

Engineering, Computer Engineering, Electrical Engineering +17

Measurement and modeling of self-heating in SOI nMOSFET's

L.T. Su, J.E. Chung, D.A. Antoniadis et al. · IEEE Transactions on Electron Devices · 1994 · 331 citations

Engineering, Electrical Engineering, Heat Transfer +16

Deep-submicrometer channel design in silicon-on-insulator (SOI) MOSFET's

L.T. Su, J.B. Jacobs, J.E. Chung et al. · IEEE Electron Device Letters · 1994 · 94 citations

Engineering, Electrical Engineering, Materials Science +17

Annealing-temperature dependence of the thermal conductivity of LPCVD silicon-dioxide layers

Kenneth E. Goodson, M. I. Flik, L.T. Su et al. · IEEE Electron Device Letters · 1993 · 92 citations

Engineering, Materials Engineering, Materials Science +17

Prediction and Measurement of the Thermal Conductivity of Amorphous Dielectric Layers

Kenneth E. Goodson, M. I. Flik, L.T. Su et al. · Journal of Heat Transfer · 1994 · 87 citations

Natural Sciences, Materials Engineering, Materials Science +17