Measurement of noise characteristics of MEMS accelerometers

A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors

Kuo-Hsiang Hung, P.K. Ko, Chenming Hu et al. · IEEE Transactions on Electron Devices · 1990 · 881 citations

Engineering, Electrical Engineering, Microelectronics +16

Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures

Jimmin Chang, A.A. Abidi, C.R. Viswanathan · IEEE Transactions on Electron Devices · 1994 · 302 citations

Engineering, Electrical Engineering, Electronic Materials +16

MEMS: micro technology, mega impact

David J. Nagel, Mona Zaghloul · IEEE Circuits and Devices Magazine · 2001 · 47 citations

Engineering, Mechanical Engineering, Microelectromechanical Systems +9