Publication | Closed Access
Quantitative depth profiling of photoacid generators in photoresist materials by near-edge X-ray absorption fine structure spectroscopy
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Citations
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References
2006
Year
Materials ScienceX-ray CrystallographyPhotoacid GeneratorsPhotoresist MaterialsX-ray SpectroscopyEngineeringPhotochemistryOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsX-ray DiffractionQuantitative Depth ProfilingX-ray OpticX-ray Fluorescence
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