2008 · 15 citations · 2 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingFault-tolerant SystemsMicroelectronicsDefect DetectionDesign For TestabilityDevice ReliabilityFault DetectionHardware Fault ToleranceTiming AnalysisCmos ReliabilityCmos ScalingDelay Fault TestingHardware DiagnosticsHardware Fault DetectionPath Delay AnalysisTiming Error DetectionTiming Faults
As continuous process scaling produces large-scale chips, small-delay defects become one of the major chip-reliability limiters. Small-delay defect detection techniques for LSI screening have been developed, which can successfully detect outlier chips among normally-distributed chips in a short testing time. In our experiments with 90nm CMOS 100MHz test chips, we have successfully detected around 1-ns path-delay shift caused by small-delay defects in only 1/25 of testing time.
2
Delay defect screening using process monitor structures
Subhasish Mitra, E. Volkerink, E.J. McCluskey et al. · 2004 · 68 citations
Engineering, Computer Engineering, Electrical Engineering +17