X-Ray Topographic Studies of Defects in PVT 6H-SiC Substrates and Epitaxial 6H-SiC Thin Films

Capillary equilibria of dislocated crystals

F. C. Frank · Acta Crystallographica · 1951 · 622 citations

Natural Sciences, Physics, Condensed Matter Physics +9

Recent developments in SiC single-crystal electronics

P. A. Ivanov, V. E. Chelnokov · Semiconductor Science and Technology · 1992 · 262 citations

Engineering, Electrical Engineering, Materials Science +17

Use of synchrotron radiation in X-ray diffraction topography

K. Naukkarinen, P. Rabe · physica status solidi (a) · 1974 · 239 citations

Natural Sciences, Materials Science, Physics +16

Single crystal growth of SiC substrate material for blue light emitting diodes

G. Ziegler, P. Lanig, D. Theis et al. · IEEE Transactions on Electron Devices · 1983 · 198 citations

Engineering, Materials Engineering, Materials Science +17

6H-silicon carbide devices and applications

John W. Palmour, J. A. Edmond, Hoyoul Kong et al. · Physica B Condensed Matter · 1993 · 186 citations

Engineering, Materials Engineering, Materials Science +12