Use of synchrotron radiation in X-ray diffraction topography

Abstract

Synchrotron radiation which is emitted into a narrow cone and which has a continuous spectrum was succesfully used in X-ray topography. The exposure time to take a set of topographs (a transmission Laue pattern) from a silicon crystal on a fine grain film with a geometric resolution of a few microns turned out to be as short as some seconds. As an example for the use of the new method the contrast formation of a defect in the Laue pattern of topographs was analysed in detail. For this purpose the relative integrated intensities of different orders of reflections were calculated. They and the calculated values of extinction distances were used to estimate the image width of a dislocation whose Burgers vector could be determined.