Harmful voltage overshoots due to turn-on behaviour of ESD protections during fast transients

Concepts

EngineeringElectrical EngineeringMicroelectronicsDevice ReliabilityElectrostatic Discharge ProtectionPhysical Protection SystemsProtection SystemsFailure ModesProtectionRise TimeTransient Protection DevicesTurn-on Mechanisms

Abstract

Due to the reaction time of the devices, the rise time of an ESD pulse has a strong effect on the efficiency of a protection network. (vf-)TLP clearly causes different failure modes depending on the rise time. This knowledge is needed to design protections that can handle fast ESD transients.

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Engineering, Electrical Engineering, Instrumentation +16

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Engineering, Electrical Engineering, Low-power Design +10

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Engineering, Electrical Engineering, Low-power Design +8