Post-growth and <i>in situ</i> annealing on GaInNAs(Sb) and their application in 1.55 µm lasers

Hailin Zhao, Yiqin Xu, H. Q. Ni, S Y Zhang, Q. Han, Yuanxin Du, Xuke Yang, Runhui Wu, Z. C. Niu

Semiconductor Science and Technology · 2006 · 10 citations · 8 references

Concepts

Abstract

Rapid thermal annealing (RTA) has been demonstrated as an important way to improve the crystal quality of GaInNAs(Sb)/GaAs quantum wells. However little investigation has been made into their application in laser growth, especially at a wavelength of 1.55 µm. When a GaAs-based laser is grown, AlGaAs is usually used for cladding layers. The growth of the p-cladding layer usually takes 30–45 min at a growth temperature higher than that of the GaInNAs(Sb) active region, which affects the material quality. To investigate this effect, various post-growth annealing processes were performed to simulate this process. Great enhancement of the PL intensity was obtained by a two-step process which consisted of annealing first at 700 °C for 60 s and then at 600 °C for 45 min. We transferred this post-growth annealing to in situ annealing. Finally, a GaInNAsSb laser was grown with a 700 °C in situ annealing process. Continuous operation at room temperature of a GaAs-based dilute nitride laser with a wavelength beyond 1.55 µm was realized for the first time.

References

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