Performance and Stability of Large-Area 4H-SiC 10-kV Junction Barrier Schottky Rectifiers

Brett Hull, Joseph J. Sumakeris, Michael O’Loughlin, Qingchun Zhang, Jim Richmond, Adrian R. Powell, Eugene A. Imhoff, Karl D. Hobart, Angel Rivera-Lopez, Allen R. Hefner

IEEE Transactions on Electron Devices · 2008 · 91 citations · 20 references

Concepts

Abstract

The forward and reverse bias dc characteristics, the long-term stability under forward and reverse bias, and the reverse recovery performance of 4H-SiC junction barrier Schottky (JBS) diodes that are capable of blocking in excess of 10 kV with forward conduction of up to 10 A at a forward voltage of less than 3.5 V (at 25degC) are described. The diodes show a positive temperature coefficient of resistance and a stable Schottky barrier height of up to 200degC. The diodes show stable operation under continuous forward current injection at 20 A/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> and under continuous reverse bias of 8 kV at 125degC. When switched from a 10-A forward current to a blocking voltage of 3 kV at a current rate-of-fall of 30 A/mus, the reverse recovery time and the reverse recovery charge are nearly constant at 300 ns and 425 nC, respectively, over the entire temperature range of 25degC-175degC.

References

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