Investigation of Single-Event Transients in Linear Voltage Regulators

Farokh Irom, T. F. Miyahira, Philippe C. Adell, Jamie S. Laird, Brandon Conder, V. Pouget, F. Essely

IEEE Transactions on Nuclear Science · 2008 · 20 citations · 11 references

Concepts

Abstract

Single-event transients (SETs) from heavy ions and laser beam are investigated for two positive adjustable linear voltage regulators: the RH117 from linear technology and the HS-117RH from Intersil. Both positive and negative going transients are observed. The role of input voltage, load capacitance and supply current on the SET response is discussed.

References

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