Cube-Contained Random Patterns and Their Applications to the Complete Testing of Synthesized Multi-Level Circuits

Abstract

The novel concept of cube-contained random patterns represents an alternative to weighted random pattern testing. Reductions in random pattern test lengths are achieved by the successive assignment of temporarily fixed values to selected inputs during the random pattern generation process. Experimental results show that cube-contained random patterns can achieve 100% fault coverage of synthesized ciscuits using orders of magnitude less patterns than when equiprobable random patterns are used.