Spectroscopic ellipsometry measurements of Al Ga1−N in the energy range 3–25 eV

T. Wethkamp, K. Wilmers, N. Esser, W. Richter, O. Ambacher, H. Angerer, G. Jungk, Robert L. Johnson, M. Cardona

Thin Solid Films · 1998 · 61 citations · 14 references

Concepts

References

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