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Spectroscopic ellipsometry measurements of Al Ga1−N in the energy range 3–25 eV

DOI

61

Citations

14

References

1998

Year

T. Wethkamp, K. Wilmers, N. Esser, W. Richter, O. Ambacher, H. Angerer, G. Jungk, Robert L. Johnson, M. Cardona
Thin Solid Films

References

YearCitations

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