Solid-State Electronics · 1981 · 17 citations · 18 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesAvalanche ProcessesDevice CharacterizationDevice ModelingDevice ReliabilityDevice SimulationSemiconductor ReliabilityAvalanche BreakdownAvalanche ModelingBreakdown MechanismsBreakdown VoltageMosfet Modeling
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Avalanche Breakdown in Silicon
K. G. McKay · Physical Review · 1954 · 478 citations
Ionization Rates for Holes and Electrons in Silicon
S. L. Miller · Physical Review · 1957 · 269 citations