Concepedia

Impact of high-k gate stack material with metal gates on LF noise in n- and p-MOSFETs

P. Srinivasan, Eddy Simoen, L. Pantisano, Cor Claeys, D. Misra

Microelectronic Engineering · 2005 · 38 citations · 8 references

Concepts

EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsComplementary Metal-oxide-semiconductor TechnologyMetal-oxide-semiconductor Field-effect TransistorsNoiseNoise In Electronic DevicesNoise In Semiconductor DevicesSemiconductor Device MaterialsAvalanche NoiseGate Oxide Thickness EffectsGate Stack EngineeringMetal GatesMosfet NoiseNoise In Field-effect TransistorsNoise In Metal-oxide-semiconductor Field-effect Transistors

References

8

High-κ gate dielectrics: Current status and materials properties considerations

G. D. Wilk, Robert M. Wallace, J. Anthony · Journal of Applied Physics · 2001 · 5.9K citations

Engineering, Materials Engineering, Materials Science +17

1/f noise sources

F.N. Hooge · IEEE Transactions on Electron Devices · 1994 · 993 citations · Full text

Engineering, Electrical Engineering, Physics +16

Improved Analysis of Low Frequency Noise in Field-Effect MOS Transistors

G. Ghibaudo, O. Roux, Ch. Nguyen-Duc et al. · physica status solidi (a) · 1991 · 759 citations

Engineering, Electrical Engineering, Circuit Theory +16

A 1/f noise technique to extract the oxide trap density near the conduction band edge of silicon

Rahul Jayaraman, C.G. Sodini · IEEE Transactions on Electron Devices · 1989 · 416 citations

Engineering, Electrical Engineering, Microelectronics +16

On the flicker noise in submicron silicon MOSFETs

E. Simoen, C. Claeys · Solid-State Electronics · 1999 · 304 citations

Engineering, Electrical Engineering, Materials Science +14