Avalanche Noise is a type of electronic noise arising from the random generation of charge carriers due to impact ionization during avalanche breakdown in semiconductor devices, distinguished from other forms of noise by its occurrence in high-field regions and its associated excess noise factor.
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2017–2026
39
Variants
Impact Ionization Noise
Publications
307
Avalanche Breakdown in Silicon
K. G. McKay · Physical Review · 1954 · 478 citations
Noise modeling for RF CMOS circuit simulation
A.J. Scholten, L.F. Tiemeijer, R. van Langevelde et al. · IEEE Transactions on Electron Devices · 2003 · 379 citations
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1–5 of 878
Institutions
304
University of Sheffield
Sheffield, United Kingdom
24 h-index
180 publications
8K citations
The University of Texas at Austin
Austin, United States
17 h-index
86 publications
4.7K citations
University of Virginia
Charlottesville, United States
10 h-index
33 publications
1.8K citations
Centre National de la Recherche Scientifique
Paris, France
8 h-index
27 publications
1.3K citations
Politecnico di Milano
Milan, Italy
7 h-index
29 publications
1.2K citations
Cornell University
Ithaca, United States
7 h-index
13 publications
1.8K citations
Fujitsu (Japan)
Kawasaki, Japan
7 h-index
29 publications
818 citations
University of New Mexico
Albuquerque, United States
6 h-index
10 publications
308 citations
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Venues
- IEEE Transactions on Electron Devices
44 publications · 4.3K citations
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- Applied Physics Letters
26 publications · 1.2K citations
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- Journal of Applied Physics
24 publications · 865 citations
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- IEEE Journal of Quantum Electronics
17 publications · 625 citations
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- Electronics Letters
16 publications · 426 citations
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