Mathematical Modeling of Electrostatic MEMS with Tailored Dielectric Properties

John A. Pelesko

SIAM Journal on Applied Mathematics · 2002 · 164 citations · 28 references

Concepts

Abstract

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This severely restricts<sup> </sup>the range of stable operation of many devices. In an<sup> </sup>attempt to reduce the effects of this instability, researchers have<sup> </sup>suggested spatially tailoring the dielectric properties of MEMS devices. Here,<sup> </sup>a mathematical model of an idealized <span class=3DSpellE>electrostatically</span> actuated MEMS device<sup> </sup>is constructed and analyzed for the purpose of investigating this<sup> </sup>possibility. The pull-in instability is characterized in terms of the<sup> </sup>bifurcation diagram for the mathematical model. Variations in this bifurcation<sup> </sup>diagram for various dielectric profiles are studied, yielding insight into<sup> </sup>how this technique may be used to increase the stable<sup> </sup>range of operation of <span class=3DSpellE>electrostatically</span> actuated MEMS devices.<sup> <o:p></o:p></sup></span> <p style=3D'text-align:justify'><span lang=3DEN-US style=3D'font-size:11.0pt; mso-ansi-language:EN-US'><o:p>&nbsp;</o:p></span> </div> </body> </html>

References

28