Publication | Closed Access
Electrical properties of high-κ gate dielectrics: Challenges, current issues, and possible solutions
274
Citations
55
References
2006
Year
Semiconductor TechnologyElectrical EngineeringSemiconductor DeviceEngineeringHigh Voltage EngineeringBias Temperature InstabilityApplied PhysicsTime-dependent Dielectric BreakdownHigh-κ Gate DielectricsPossible SolutionsMicroelectronicsElectrical PropertiesElectrical Insulation
| Year | Citations | |
|---|---|---|
Page 1
Page 1