Journal of Applied Physics · 2009 · 59 citations · 19 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials PhysicsThin FilmsDielectricsElectron-phonon InteractionsMetalsOptical Properties Of SemiconductorsOptical Properties Of SolidsThin Film Electrical PropertiesBand GapBrillouin ZonesConduction BandCritical PointsDielectric FunctionIndirect Band GapValence BandValence Band Structure
The dielectric function (DF) of phase-pure cubic AlN films is determined by ellipsometry. The sharp onset of the imaginary part of the DF defines the direct absorption edge corresponding to a conduction-to-valence band spacing at the center of the Brillouin zone (BZ) of 5.93 eV. Phonon-assisted transitions lead to the pronounced absorption tail below this edge from which the indirect gap of zinc-blende AlN is estimated with 5.3 eV. Transitions due to four additional critical points of the BZ are resolved at higher photon energies. The high-frequency and static dielectric constants are determined with 4.25 and 8.07, respectively.
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Deposition factors and band gap of zinc-blende AlN
Margarita P. Thompson, Gregory W. Auner, Tsvetanka Zheleva et al. · Journal of Applied Physics · 2001 · 120 citations
Dielectric function of wurtzite GaN and AlN thin films
Lorin X. Benedict, T. Wethkamp, K. Wilmers et al. · Solid State Communications · 1999 · 89 citations