Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level - Concepedia

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Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

42

Citations

34

References

2010

Year

Jean‐Luc Autran, Daniela Munteanu, P. Roche, Gilles Gasiot, S. Martinie, Sławosz Uznański, S. Sauze, S. S. Semikh, E. Yakushev, S. Rozov,

Microelectronics Reliability

Electrical EngineeringEngineeringNuclear PhysicsPhysicsHardware ReliabilityNatural SciencesTerrestrial NeutronsGround LevelNeutron SourceAdvanced Memory CircuitsSemiconductor MemoryNeutron ScatteringNuclear EngineeringNuclear Astrophysics

References

	Year	Citations

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