Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

Jean‐Luc Autran, Daniela Munteanu, P. Roche, Gilles Gasiot, S. Martinie, Sławosz Uznański, S. Sauze, S. S. Semikh, E. Yakushev, S. Rozov,

Microelectronics Reliability · 2010 · 42 citations · 34 references

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