Sławosz Uznański

Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops

Sławosz Uznański, Gilles Gasiot, Philippe Roché et al. · IEEE Transactions on Nuclear Science · 2010 · 76 citations

Engineering, Computer Engineering, Electrical Engineering +17

LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA Implications

Rubén García Alía, Markus Brugger, F. Cerutti et al. · IEEE Transactions on Nuclear Science · 2017 · 70 citations · Full text

Natural Sciences, Nuclear Engineering, Particle Physics +16

A Commercial 65 nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and Modeling

Philippe Roché, Gilles Gasiot, Sławosz Uznański et al. · IEEE Transactions on Nuclear Science · 2010 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +17

Single event effects in high-energy accelerators

Rubén García Alía, Markus Brugger, Salvatore Danzeca et al. · Semiconductor Science and Technology · 2017 · 45 citations · Full text

Natural Sciences, Nuclear Engineering, Physics +15

Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

Jean‐Luc Autran, Daniela Munteanu, P. Roche et al. · Microelectronics Reliability · 2010 · 42 citations

Engineering, Electrical Engineering, Physics +17