S. Sauze - Concepedia

Author

S. Sauze

Aix-Marseille Université

Also Known As

S Sauze, S. Sauze, Sauze, Sebastien, Sauze, Sébastien, Sebastien Sauze

Publications

288

Citations

H-Index

Concepts

All Affiliations

Aix-Marseille Université Institut des Matériaux, de Microélectronique et des Nanosciences de Provence Centre National de la Recherche Scientifique STMicroelectronics (France)Commissariat à l'Énergie Atomique et aux Énergies Alternatives

About

S. Sauze is an author at Aix-Marseille Université specializing in electrical engineering, engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	218
2	Computer Engineering	5	5	162
3	Natural Sciences	4	4	141
4	Applied Physics	4	4	116
5	Education	1	1	24

S. Sauze

Publications

253

Citations

H-Index

Page 1

	Year	Citations
Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM Jean‐Luc Autran, P. Roche, S. Sauze, IEEE Transactions on Nuclear Science EngineeringVlsi DesignNuclear PhysicsEmerging Memory TechnologyComputer Architecture	2009	60
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level Jean‐Luc Autran, Daniela Munteanu, P. Roche, Microelectronics Reliability Electrical EngineeringEngineeringNuclear PhysicsPhysicsHardware Reliability	2010	42
Real-time Soft-Error testing of 40nm SRAMs Jean‐Luc Autran, S. Serre, Daniela Munteanu, Hardware SecurityElectrical EngineeringNatural RadiationEngineeringVlsi Design	2012	36
Underground Experiment and Modeling of Alpha Emitters Induced Soft-Error Rate in CMOS 65 nm SRAM Sébastien Martinie, Jean‐Luc Autran, S. Sauze, IEEE Transactions on Nuclear Science EngineeringVlsi DesignNuclear PhysicsIntegrated CircuitsNm Sram	2012	25
Real-time neutron and alpha soft-error rate testing of CMOS 130nm SRAM: Altitude versus underground measurements Jean‐Luc Autran, P. Roche, S. Sauze, EngineeringMeasurementMem TestingCmos 130NmEducation	2008	24
Soft errors induced by natural radiation at ground level in floating gate flash memories G. Just, Jean‐Luc Autran, S. Serre, Non-volatile MemoryElectrical EngineeringNatural RadiationCombined CharacterizationEngineering	2013	17
Alpha-Particle Induced Soft-Error Rate in CMOS 130 nm SRAM S. Martinie, Jean‐Luc Autran, Sławosz Uznański, IEEE Transactions on Nuclear Science EngineeringNuclear PhysicsNuclear DataUranium ContaminationNm Sram	2011	14
The Plateau de Bure Neutron Monitor: Design, Operation and Monte Carlo Simulation S. S. Semikh, S. Serre, J.L. Autran, IEEE Transactions on Nuclear Science	2012	13
Altitude and Underground Real-Time SER Testing of SRAMs Manufactured in CMOS Bulk 130, 65 and 40 nm Jean‐Luc Autran, Daniela Munteanu, S. Sauze,	2014	12
ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure Jean‐Luc Autran, Daniela Munteanu, S. Moindjie, Microelectronics Reliability	2015	10

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