Applied Physics Letters · 2003 · 54 citations · 15 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsOptical Thin FilmsPhotodetectorsUltraviolet DetectorsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsBand GapCurrent DensityLeakage CurrentPassivationReflectivitySolar-blind DetectorsSuperlatticesUltraviolet Photodetectors
We describe solar-blind photodetectors based on superlattices of AlN/AlGa(In)N. The superlattices have a period of 1.4 nm, determined by x-ray diffraction, and an effective band gap of 260 nm measured by optical reflectivity. Using simple mesa diodes, without surface passivation, we obtain low dark leakage currents of 0.2–0.3 pA, corresponding to the leakage current density of ∼0.3 nA/cm2, and high zero-bias resistance of ∼1×1011 Ω. Excellent visible cutoff is obtained for these devices, with six orders of magnitude decrease in responsivity from 260 to 380 nm. These results demonstrate the potential of junctions formed by short-period superlattices in large-band-gap devices.
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Optical and electrical properties of Mg-doped <i>p</i>-type AlxGa1−xN
J. Li, Tom Oder, M. L. Nakarmi et al. · Applied Physics Letters · 2002 · 161 citations
Natural Sciences, Materials Engineering, Materials Science +17
Al Ga1−N for solar-blind UV detectors
Peter Sandvik, Kan Mi, F. Shahedipour et al. · Journal of Crystal Growth · 2001 · 109 citations
Natural Sciences, Materials Engineering, Materials Science +13