Leakage Current

Leakage Current is a parasitic electric current that flows undesirably through or across an insulating region or device under non-operational or reverse-biased conditions, differing from conduction or diffusion currents by originating from imperfections, thermal generation, or tunneling mechanisms rather than intentional charge transport.

3.2K

Publications

129.3K

Citations

11.6K

Authors

1.7K

Institutions

Publications per year

2017–2026

724

Authors

11.6K

  1. CS
    Cheol Seong Hwang

    Seoul National University, South Korea

    45 publications · 2.4K citations

    29

    h-index

  2. SY
    Soon‐Gil Yoon

    Chungnam National University, South Korea

    24 publications · 782 citations

    17

    h-index

  3. HI
    Hiroshi Ishiwara

    Tokyo Institute of Technology, Japan

    19 publications · 1.7K citations

    17

    h-index

  4. RD
    Ronald D. Schrimpf

    Vanderbilt University, United States

    14 publications · 777 citations

    15

    h-index

  5. HF
    Hiroshi Funakubo

    Tokyo Institute of Technology, Japan

    19 publications · 555 citations

    13

    h-index

1–5 of 11.6K

Venues

  1. Applied Physics Letters

    415 publications · 22.6K citations

    74

    h-index

  2. Journal of Applied Physics

    257 publications · 12.4K citations

    58

    h-index

  3. IEEE Transactions on Electron Devices

    159 publications · 7.2K citations

    45

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 204 publications · 6.4K citations

    43

    h-index

  5. IEEE Electron Device Letters

    132 publications · 5.4K citations

    41

    h-index

1–5