Applied Physics Express · 2008 · 27 citations · 16 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMaterials ChemistrySemiconductor MaterialsAluminum OxidesChemical Vapor DepositionCrystal GrowthSemiconductor Crystal GrowthThin-film DepositionX-ray CrystallographyCathodoluminescence MicroscopyCrystalline StructureFilm Growth MechanismsMetalorganic Chemical Vapor DepositionSurface CoverageSurface Coverage AnalysisThin-film Growth MechanismsX-ray Diffraction Analysis
Improvement of Al-polar AlN layer quality was accomplished by three-stage flow-modulation metalorganic chemical vapor deposition (FM-MOCVD). In this method, the unit of the FM-MOCVD sequence was composed of three stages; Stage I for simultaneous source supply, Stage II for trimethylaluminum supply, and Stage III for ammonia supply, which were cyclically repeated. The AlN quality revealed by X-ray diffraction strongly depended on the time of Stage I. A growth model was proposed considering the surface coverage of the islands nucleated during Stage I. Exciton fine structures were eventually observed by low-temperature cathodoluminescence reflecting the tremendously improved crystalline quality.
16
M. Asif Khan, M. Shatalov, H. P. Maruska et al. · Japanese Journal of Applied Physics · 2005 · 420 citations · Full text