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Diffusion and strain relaxation in Si/Si1−Ge /Si structures studied with Rutherford backscattering spectrometry

DOI

20

Citations

9

References

1990

Year

L.J. van IJzendoorn, G. F. A. van de Walle, A. A. van Gorkum, A. M. L. Theunissen, R.A. van den Heuvel, J. H. Barrett
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

References

YearCitations

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