Concepedia

SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities

Vasily S. Anashin, Aleksandr E. Koziukov, Anatoly A. Kazyakin, Alexander S. Kuznetsov, Linaris R. Bakirov, Viacheslav S. Korolev, Kirill A. Artemyev, Konstantin Zh. Faradian

2014 · 11 citations · 2 references

DOI

Concepts

EngineeringAerospace EngineeringElectrical EngineeringEquipmentInstrumentationMicroelectronicsDesign For TestabilityDevice CharacterizationElectrical System TestingMaterial TestingSatellite InstrumentationSpacecraft TestElectrical TestabilityHardnessInterpretation Of Test ResultsNon-destructive TestingTest Instrumentation

Abstract

The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.

References

2

Single Event Transients in Digital CMOS—A Review

V. Ferlet-Cavrois, L. W. Massengill, Pascale Gouker · IEEE Transactions on Nuclear Science · 2013 · 396 citations

Engineering, Computer Engineering, Computer Science +17

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

Robert A. Reed, J.D. Kinnison, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 81 citations

Engineering, Aerospace Engineering, Systems Engineering +16