Concepedia

Electrical Testability

Electrical Testability is a performance metric within the domain of chip packaging that quantifies the degree to which electrical functionality and integrity can be verified through standardized testing methodologies, distinguishing it from other packaging-level attributes by its focus on signal accessibility, fault detection, and parametric measurement accuracy under real-world operating conditions.

501

Publications

16.5K

Citations

1.3K

Authors

353

Institutions

Publications per year

2017–2026

31

Parents

Publications

501

Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

Galiay, Crouzet, Vergniault · IEEE Transactions on Computers · 1980 · 362 citations

, , +14

SCOAP

L. H. Goldstein, Evelyn L. Thigpen · 1980 · 357 citations · Full text

, , +7

Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic

Monika Williams, James B. Angell · IEEE Transactions on Computers · 1973 · 303 citations

, , +13

An experimental chip to evaluate test techniques experiment results

Siyad Ma, P. Franco, E.J. McCluskey · 2002 · 277 citations

, , +12

Detection of catastrophic faults in analog integrated circuits

Linda Milor, V. Visvanathan · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989 · 241 citations

, , +14

1–5 of 501

Authors

1.3K

  1. KC
    Krishnendu Chakrabarty

    Duke University, United States

    10 publications · 393 citations

    10

    h-index

  2. CH
    C.F. Hawkins

    University of New Mexico, United States

    10 publications · 454 citations

    10

    h-index

  3. AC
    Abhijit Chatterjee

    Georgia Institute of Technology, United States

    11 publications · 346 citations

    10

    h-index

  4. EM
    E.J. McCluskey

    Stanford University, United States

    9 publications · 721 citations

    9

    h-index

  5. HS
    Haralampos‐G. Stratigopoulos

    Centre National de la Recherche Scientifique, France

    9 publications · 244 citations

    9

    h-index

1–5 of 1.3K

Institutions

353

  1. IBM (United States)

    Armonk, United States

    20 h-index

    72 publications

    2.6K citations

  2. Intel (United States)

    Santa Clara, United States

    18 h-index

    47 publications

    2.3K citations

  3. Philips (Netherlands)

    Amsterdam, The Netherlands

    17 h-index

    45 publications

    1.7K citations

  4. Georgia Institute of Technology

    Atlanta, United States

    14 h-index

    48 publications

    1.7K citations

  5. Centre National de la Recherche Scientifique

    Paris, France

    13 h-index

    36 publications

    1.2K citations

  6. Stanford University

    Stanford, United States

    13 h-index

    27 publications

    1.8K citations

  7. Duke University

    Durham, United States

    13 h-index

    33 publications

    1K citations

  8. Texas Instruments (United States)

    Dallas, United States

    13 h-index

    43 publications

    1.6K citations

1–8 of 353

Venues

  1. 15

    h-index

  2. IEEE Design & Test of Computers

    11 publications · 342 citations

    11

    h-index

  3. Journal of Electronic Testing

    JETTA · 11 publications · 376 citations

    10

    h-index

  4. Microelectronics Reliability

    9 publications · 154 citations

    9

    h-index

  5. 8

    h-index

1–5