Modeling bimodal electromigration failure distributions

Mass Transport of Aluminum by Momentum Exchange with Conducting Electrons

James R. Black · Physics of failure in electronics · 1967 · 222 citations

Engineering, Charge Transport, Transport Phenomena +16

A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown

R. Degraeve, J.-L. Ogier, R. Bellens et al. · IEEE Transactions on Electron Devices · 1998 · 128 citations

Dielectrics, Engineering, Mechanical Engineering +22

Electromigration and mechanical stress

J. R. Lloyd · Microelectronic Engineering · 1999 · 64 citations

Electroactive Material, Electromigration Technique, Electrohydrodynamics +8

On the log-normal distribution of electromigration lifetimes

J. R. Lloyd · Journal of Applied Physics · 1979 · 33 citations

Reliability, Electrical Engineering, Reliability Engineering +15

Experimental data and statistical models for bimodal EM failures

A. Fischer, Andreas Abel, Markus Lepper et al. · 2002 · 32 citations

Engineering, Mechanical Engineering, Electromagnetic Compatibility +16