Silicon lifetime enhancement by SiNx:H anti-reflective coating deposed by PECVD using SiH4 and N2 reactive gas

Contactless determination of current–voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data

Ronald A. Sinton, Andrés Cuevas · Applied Physics Letters · 1996 · 1.6K citations

Engineering, Quasi-steady-state Photoconductance, Semiconductor Materials +20

Measuring and interpreting the lifetime of silicon wafers

Andrés Cuevas, Daniel Macdonald · Solar Energy · 2003 · 309 citations

Reliability, Materials Engineering, Silicon Wafers +7

Study of the composition of hydrogenated silicon nitride SiNx:H for efficient surface and bulk passivation of silicon

J.‐F. Lelièvre, Erwann Fourmond, A. Kaminski et al. · Solar Energy Materials and Solar Cells · 2009 · 168 citations · Full text

Chemical Engineering, Engineering, Efficient Surface +7

Optical Properties of Cadmium Sulfide and Zinc Sulfide from 06 Micron to 14 Microns

Joseph F. Hall, W. F. C. Ferguson · Journal of the Optical Society of America · 1955 · 134 citations

Optical Materials, Engineering, Chemistry +17

Fourier transform infrared spectroscopy of annealed silicon-rich silicon nitride thin films

Giuseppe Scardera, T. Puzzer, Gavin Conibeer et al. · Journal of Applied Physics · 2008 · 122 citations

Engineering, Silicon On Insulator, Semiconductor Nanostructures +16