Measuring and interpreting the lifetime of silicon wafers

Statistics of the Recombinations of Holes and Electrons

W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations

Engineering, Electrical Engineering, Recombination +15

Electron-Hole Recombination in Germanium

R. N. Hall · Physical Review · 1952 · 2.7K citations

Natural Sciences, Materials Science, Physics +7

Contactless determination of current–voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data

Ronald A. Sinton, Andrés Cuevas · Applied Physics Letters · 1996 · 1.6K citations

Engineering, Electrical Engineering, Materials Science +17

Electron and hole mobilities in silicon as a function of concentration and temperature

Neha Arora, John R. Hauser, D.J. Roulston · IEEE Transactions on Electron Devices · 1982 · 960 citations

Natural Sciences, Materials Science, Physics +11

Measurement of the emitter saturation current by a contactless photoconductivity decay method.

D.E. Kane, R.M. Swanson · Photovoltaic Specialists Conference · 1985 · 447 citations

Engineering, Electrical Engineering, Electronic Materials +9