Concepedia

Atomic force microscope for planetary applications

Takeo Akiyama, Sébastian Gautsch, Ν. F. de Rooij, U. Staufer, Ph. Niedermann, L. Howald, Daniel J. Müller, A. Tonin, H.‐R. Hidber, W. T. Pike,

Sensors and Actuators A Physical · 2001 · 22 citations · 5 references

DOI

Concepts

References

5

Atomic resolution with an atomic force microscope using piezoresistive detection

M. Tortonese, R. C. Barrett, C. F. Quate · Applied Physics Letters · 1993 · 639 citations

, , +17

New views of Mars eolian activity, materials, and surface properties: Three vignettes from the Mars Global Surveyor Mars Orbiter Camera

K. S. Edgett, M. C. Malin · Journal of Geophysical Research Atmospheres · 2000 · 151 citations · Full text

, , +16

Optical properties of the Martian aerosols as derived from Imager for Mars Pathfinder midday sky brightness data

W. J. Markiewicz, R. M. Sablotny, H. U. Keller et al. · Journal of Geophysical Research Atmospheres · 1999 · 123 citations · Full text

, , +16

Advanced deep reactive ion etching: a versatile tool for microelectromechanical systems

P-A Clerc, L. Dellmann, François Gretillat et al. · Journal of Micromechanics and Microengineering · 1998 · 56 citations · Full text

, , +17

Mounting of micromachined diamond tips and cantilevers

Ph. Niedermann, W. Hänni, S. Thurre et al. · Surface and Interface Analysis · 1999 · 10 citations · Full text

, , +10