A. Tonin

Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer

M. H. Hecht, J. P. Marshall, W. T. Pike et al. · Journal of Geophysical Research Atmospheres · 2008 · 240 citations · Full text

Natural Sciences, Materials Science, Nanotechnology +10

Integrated atomic force microscopy array probe with metal–oxide–semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal–oxide–semiconductor electronics

Takeo Akiyama, U. Staufer, Ν. F. de Rooij et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 61 citations

Engineering, Electrical Engineering, Materials Science +17

Parallel scanning AFM with on-chip circuitry in CMOS technology

D. Lange, Takeo Akiyama, Christoph Hagleitner et al. · 1999 · 24 citations

Engineering, Electrical Engineering, Actuators +16

Atomic force microscope for planetary applications

Takeo Akiyama, Sébastian Gautsch, Ν. F. de Rooij et al. · Sensors and Actuators A Physical · 2001 · 22 citations

Natural Sciences, Materials Science, Physics +10

Solar heat gains through train windows: a non-negligible contribution to the energy balance

Olivia Bouvard, Luc Burnier, P. Oelhafen et al. · Energy Efficiency · 2018 · 12 citations · Full text

Natural Sciences, Building Science, Energy Systems +16