Atomic Force Microscopy Surface Analysis

Atomic Force Microscopy Surface Analysis is a nanoscale characterization method that distinguishes itself by enabling three-dimensional topographical mapping and quantitative measurement of surface properties at atomic resolution through controlled probe-sample interactions in a vacuum or ambient environment.

3.2K

Publications

189.3K

Citations

9.3K

Authors

1.9K

Institutions

Publications per year

2017–2026

345

Authors

9.3K

  1. BB
    Bharat Bhushan

    The Ohio State University, United States

    34 publications · 2.8K citations

    29

    h-index

  2. EM
    Ernst Meyer

    University of Basel, Switzerland

    42 publications · 2.6K citations

    27

    h-index

  3. PK
    Paul K. Hansma

    University of California, Santa Barbara, United States

    34 publications · 3.5K citations

    26

    h-index

  4. FJ
    Franz J. Gießibl

    University of Regensburg, Germany

    24 publications · 6.7K citations

    23

    h-index

  5. HY
    Hirofumi Yamada

    Kyoto University, Japan

    34 publications · 1.4K citations

    21

    h-index

1–5 of 9.3K

Venues

  1. Applied Physics Letters

    184 publications · 16K citations

    63

    h-index

  2. Langmuir

    181 publications · 10.9K citations

    59

    h-index

  3. Physical Review Letters

    PRL · 47 publications · 22K citations

    39

    h-index

  4. Nanotechnology

    93 publications · 4K citations

    34

    h-index

  5. Applied Surface Science

    117 publications · 3.8K citations

    34

    h-index

1–5