Atomic Force Microscopy Surface Analysis
Atomic Force Microscopy Surface Analysis is a nanoscale characterization method that distinguishes itself by enabling three-dimensional topographical mapping and quantitative measurement of surface properties at atomic resolution through controlled probe-sample interactions in a vacuum or ambient environment.
3.2K
Publications
189.3K
Citations
9.3K
Authors
1.9K
Institutions
Publications per year
2017–2026
345
Parents
3.2K
G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations
Natural Sciences, Materials Engineering, Materials Science +17
Advances in atomic force microscopy
Franz J. Gießibl · Reviews of Modern Physics · 2003 · 2.2K citations · Full text
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University of California, Santa Barbara, United States
34 publications · 3.5K citations
26
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23
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21
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1.9K

Centre National de la Recherche Scientifique
Paris, France
43 h-index
467 publications
19.4K citations
University of California, Santa Barbara
Santa Barbara, United States
38 h-index
215 publications
24K citations

University of Basel
Basel, Switzerland
36 h-index
293 publications
24K citations
The University of Osaka
Osaka, Japan
31 h-index
359 publications
15K citations
The University of Tokyo
Tokyo, Japan
30 h-index
161 publications
6.6K citations
The Ohio State University
Columbus, United States
29 h-index
94 publications
6.7K citations

Chinese Academy of Sciences
Beijing, China
26 h-index
268 publications
10.1K citations

University of Twente
Enschede, The Netherlands
26 h-index
150 publications
11.6K citations
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184 publications · 16K citations
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181 publications · 10.9K citations
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PRL · 47 publications · 22K citations
39
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93 publications · 4K citations
34
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117 publications · 3.8K citations
34
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