Friction measurements on phase-separated thin films with a modified atomic force microscope

René M. Overney, Ernst Meyer, Jane Frommer, +7

Nature

Materials ScienceNanotribologyEngineeringMicroscopyScanning Probe Microscopy +9

Friction and wear of Langmuir-Blodgett films observed by friction force microscopy

Ernst Meyer, René M. Overney, D. Brodbeck, +4

Physical Review Letters

Tribological CoatingEngineeringMechanical EngineeringAfm Topographic ModeSoft Matter +15

Molecular-resolution images of Langmuir–Blodgett films using atomic force microscopy

Ernst Meyer, L. Howald, René M. Overney, +6

Nature

Materials ScienceEngineeringMicroscopyMicroscopy MethodScanning Probe Microscopy +5

Sled-Type Motion on the Nanometer Scale: Determination of Dissipation and Cohesive Energies of C ₆₀

R. Lüthi, Ernst Meyer, H. Haefke, +3

Science

Friction force microscopy of mixed Langmuir-Blodgett films

Ernst Meyer, René M. Overney, R. Lüthi, +8

Thin Solid Films

Materials ScienceEngineeringFriction Force MicroscopyMechanical EngineeringSurface Science +3

Multifunctional probe microscope for facile operation in ultrahigh vacuum

L. Howald, Ernst Meyer, R. Lüthi, +4

Applied Physics Letters

Fluorescence MicroscopyForce/tunneling MicroscopeEngineeringPhysicsMicrofabrication +11

Surface and domain structures of ferroelectric crystals studied with scanning force microscopy

R. Lüthi, H. Haefke, K.-P. Meyer, +3

Journal of Applied Physics

EngineeringMicroscopyDomain Wall StructureForce MicroscopyMultiferroics +14

Site-specific friction force spectroscopy

Ernst Meyer, R. Lüthi, L. Howald, +3

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

EngineeringRock SlopeMechanical EngineeringNanotribologyFriction Control +14

Nanotribology: an UHV-SFM study on thin films of C60 and AgBr

R. Lüthi, Ernst Meyer, H. Haefke, +5

Surface Science

Materials ScienceUhv-sfm StudyEngineeringNanotechnologySurface Science +6

Atomic-force microscopy on the Si(111)7×7 surface

L. Howald, R. Lüthi, Ernst Meyer, +1

Physical review. B, Condensed matter

Materials ScienceSurface CharacterizationAtomic-force MicroscopyEngineeringPhysics +10