Journal of Microscopy · 2001 · 12 citations · 6 references
EngineeringBiomedical EngineeringMaterials ScienceMicrofabricationOpticsPhotonicsLight MicroscopyMems FabricationMicrofabrication MaterialsFocused Ion Beam PatterningMicrocantilever DesignNear-field Optical MicroscopyNear-field Scanning Optical MicroscopyOptical ThroughputScanning Near-field Optical MicroscopySilicon DioxideThroughput
We have developed a microfabricated SiO2 cantilever with subwavelength aperture for scanning near-field optical microscopy (SNOM), to overcome the disadvantages of conventional optical fibre probes such as low reproducibility and low optical throughput. The microcantilever, which has a SiO2 cantilever and an aperture tip near the end of the cantilever, is fabricated in a reproducible batch process. The circular aperture with a diameter of 100-150 nm is formed by a focused ion-beam technique. Incident light is directly focused on the aperture from the rear side of the cantilever using a focusing objective, and high optical throughput (10(-2) to 10(-3)) is obtained. The microcantilever can be operated as a SNOM probe in contact mode or in dynamic mode.
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Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale
Eric Betzig, J. K. Trautman, T.D. Harris et al. · Science · 1991 · 1.5K citations
Multipurpose sensor tips for scanning near-field microscopy
Ch. Mihalcea, W. Scholz, S. Werner et al. · Applied Physics Letters · 1996 · 113 citations