Novel Si-based nanowire devices: Will they serve ultimate MOSFETs scaling or ultimate hybrid integration?

T. Ernst, Laurent Duraffourg, C. Dupré, Émilie Bernard, Philippe Andreucci, Stéphane Bécu, E. Ollier, A. Hubert, Cécile Halté, Julien Buckley,

2008 · 51 citations · 6 references

Concepts

Abstract

Both CMOS scaling and NEMS sensor devices scaling converge to the same type of sub 100 nm objects. This opens new fields of application for IC chips integrating both complex signal treatment and very highly sensitive sensing functionalities.

References

6