Solid-State Electronics · 2004 · 110 citations · 31 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSemiconductor DevicesAnalog Integrated CircuitsCmos Circuit DesignIntegrated Circuit DesignLeakage Power ReductionMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsChannel Doping EffectsChannel EngineeringDual-gate Field-effect TransistorsFully Depleted Silicon-on-insulator TransistorsGate Oxide Thickness EffectsLateral Electric Field EffectsSource-drain Engineering
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Device scaling limits of Si MOSFETs and their application dependencies
D.J. Frank, R.H. Dennard, E. Nowak et al. · Proceedings of the IEEE · 2001 · 1.6K citations
Engineering, Computer Engineering, Electrical Engineering +17
Fernando Silveira, Denis Flandre, P.G.A. Jespers · IEEE Journal of Solid-State Circuits · 1996 · 650 citations
Scaling theory for double-gate SOI MOSFET's
Ken Suzuki, Tetsu Tanaka, Y. Tosaka et al. · IEEE Transactions on Electron Devices · 1993 · 556 citations · Full text
Engineering, Electrical Engineering, Electronic Materials +16