Microfabricated diamond tip for nanoprobing

Calibration and evaluation of scanning-force-microscopy probes

Sergei S. Sheiko, Martin Möller, E.M.C.M. Reuvekamp et al. · Physical review. B, Condensed matter · 1993 · 162 citations

Natural Sciences, Materials Science, Physics +17

Chemical vapor deposition diamond for tips in nanoprobe experiments

Ph. Niedermann, W. Hänni, Nils Blanc et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1996 · 110 citations

Natural Sciences, Materials Engineering, Materials Science +17

Highly conductive diamond probes for scanning spreading resistance microscopy

Thomas Hantschel, Ph. Niedermann, Thomas Trenkler et al. · Applied Physics Letters · 2000 · 108 citations

Engineering, Materials Engineering, Materials Science +17

Peel-off probe: a cost-effective probe for electrical atomic force microscopy

Thomas Hantschel, Stefan Slesazeck, Natasja Duhayon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 14 citations

Engineering, Electrical Engineering, Materials Science +13