Thomas Trenkler

Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy

Peter Wolf, R. J. Stephenson, Thomas Trenkler et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 190 citations

Engineering, Microscopy, Semiconductor Device +22

Highly conductive diamond probes for scanning spreading resistance microscopy

Thomas Hantschel, Ph. Niedermann, Thomas Trenkler et al. · Applied Physics Letters · 2000 · 107 citations

Engineering, Microscopy, Ssrm Probe +17

Epitaxial staircase structure for the calibration of electrical characterization techniques

Trudo Clarysse, Matty Caymax, Peter Wolf et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 70 citations

Engineering, Measurement, Education +18

Evaluating probes for “electrical” atomic force microscopy

Thomas Trenkler, Thomas Hantschel, R. J. Stephenson et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 61 citations

Engineering, Conductive Afm Techniques, Microscopy +18

Nanopotentiometry: Local potential measurements in complementary metal–oxide–semiconductor transistors using atomic force microscopy

Thomas Trenkler, Peter Wolf, W. Vandervorst et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 38 citations

Atomic Force Microscopy, Cross Section, Local Potential Measurements +19