Thomas Hantschel

Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy

Peter Wolf, R. J. Stephenson, Thomas Trenkler et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 190 citations

Engineering, Microscopy, Semiconductor Device +22

Highly conductive diamond probes for scanning spreading resistance microscopy

Thomas Hantschel, Ph. Niedermann, Thomas Trenkler et al. · Applied Physics Letters · 2000 · 107 citations

Engineering, Microscopy, Ssrm Probe +17

Two-dimensional carrier profiling of InP structures using scanning spreading resistance microscopy

Peter Wolf, M. Geva, Thomas Hantschel et al. · Applied Physics Letters · 1998 · 83 citations

Engineering, Microscopy, Two-dimensional Carrier Profiling +18

Silica gel solid nanocomposite electrolytes with interfacial conductivity promotion exceeding the bulk Li-ion conductivity of the ionic liquid electrolyte filler

Xubin Chen, Brecht Put, A. Sagara et al. · Science Advances · 2020 · 78 citations · Full text

Laser-Induced Periodic Surface Structures (LIPSS) on Heavily Boron-Doped Diamond for Electrode Applications

André F. Sartori, S. Orlando, A. Bellucci et al. · ACS Applied Materials & Interfaces · 2018 · 67 citations · Full text