Natasja Duhayon - Concepedia

Author

Natasja Duhayon

IMEC

Also Known As

N. Duhayon, Natasja Duhayon

Publications

320

Citations

H-Index

Concepts

All Affiliations

IMEC KU Leuven Infineon Technologies (Germany)

About

Natasja Duhayon is an author at IMEC specializing in applied physics, engineering, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	268
2	Applied Physics	6	6	268
3	Electrical Engineering	6	6	268
4	Education	1	1	67
5	Medicine	1	1	120

Natasja Duhayon

Publications

282

Citations

H-Index

Page 1

	Year	Citations
Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling Pierre Eyben, Man Xu, Natasja Duhayon, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyIntegrated CircuitsSemiconductorsMicroscopy Method	2002	120
Assessing the performance of two-dimensional dopant profiling techniques Natasja Duhayon, Pierre Eyben, Marc Fouchier, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringElectron-beam LithographyMicroscopyMeasurementEducation	2004	67
Detailed study of scanning capacitance microscopy on cross-sectional and beveled junctions Natasja Duhayon, Trudo Clarysse, Pierre Eyben, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyBeveled JunctionsSemiconductor DeviceTunneling Microscopy	2002	28
Manufacturing of high aspect-ratio p-n junctions using vapor phase doping for application in multi-Resurf devices Carolina Corrêa Rochefort, R. van Dalen, Natasja Duhayon, EngineeringPower ElectronicsSemiconductor DeviceWafer Scale ProcessingNanoelectronics	2003	21
Carrier spilling revisited: On-bevel junction behavior of different electrical depth profiling techniques Trudo Clarysse, Pierre Eyben, Natasja Duhayon, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringSpreading Resistance ProbeOn-bevel Junction BehaviorPhysical Design (Electronics)Computational Electromagnetics	2003	18
Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping Marc Fouchier, Pierre Eyben, David Álvarez, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2003	14
Peel-off probe: a cost-effective probe for electrical atomic force microscopy Thomas Hantschel, Stefan Slesazeck, Natasja Duhayon, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMicroscopyFull Metal ProbesElectron MicroscopyMicroscopy Method	2000	14

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