Physical review. B, Condensed matter · 1993 · 162 citations · 15 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsSolid State PhysicsSurface ScienceAtomic Force MicroscopyCrystallographyDefect CharacterizationNanomaterial CharacterizationScanning Probe MicroscopySurface PhysicsAtomic Force Microscopy CalibrationAtomic Force Microscopy Image ResolutionAtomic-resolution ImagingAtomic-scale Surface ImagingDistortionsNanometer-scale ImagingNanometer-scale MetrologyStructural Defects
It is demonstrated that a stepped (305) surface of a ${\mathrm{SrTiO}}_{3}$ crystal can be used routinely to evaluate the probing profile of scanning-force-microscopy probes. This provides a means to select optimal surface probes, and to evaluate possible image distortions within the range of the atomic and nanometer scale. The scope and limitations of the resolution of structural defects are discussed as a criterion for a true atomic resolution.
15
G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
The London—van der Waals attraction between spherical particles
H. C. Hamaker · Physica · 1937 · 3.9K citations
From Molecules to Cells: Imaging Soft Samples with the Atomic Force Microscope
Manfred Radmacher, Ralf W. Tillmann, M. Fritz et al. · Science · 1992 · 889 citations