Microelectronics Reliability · 2014 · 22 citations · 17 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceFault-tolerant ComputingSystem-on-chip DesignBuilt-in Self-testDefect DetectionDesign DefectsDesign For TestabilityFault DetectionGenetic AlgorithmsDefect InspectionDefect LocalizationDevice Defect DetectionFlip-chip PackagingHardware Fault DetectionLogic Bist
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Darrell Whitley · Statistics and Computing · 1994 · 4.5K citations
Genetic algorithms and their applications
K.S. Tang, K.F. Man, Sam Kwong et al. · IEEE Signal Processing Magazine · 1996 · 1.1K citations