Device Defect Detection

Device Defect Detection is a systematic process within medical device quality assurance that identifies deviations from specified performance or safety standards through analytical, statistical, or empirical evaluation to determine the presence of faults or nonconformities that may necessitate regulatory action such as recall.

142

Publications

4.8K

Citations

509

Authors

189

Institutions

Publications per year

2017–2026

Parents

Medical Device Recalls

Publications

142

Automated defect inspection of LED chip using deep convolutional neural network

Hui Lin, Bin Li, Xinggang Wang et al. · Journal of Intelligent Manufacturing · 2018 · 240 citations

Computing, Computer Science, Electrical Engineering +16

Comparison of Defects in ProFile and ProTaper Systems after Clinical Use

Ya Shen, Gary S.P. Cheung, Zhuan Bian et al. · Journal of Endodontics · 2006 · 204 citations

Management, Endodontics, Prosthetics +6

High volume microprocessor test escapes, an analysis of defects our tests are missing

W. Needham, C. Prunty, Eng‐Kiong Yeoh · 2002 · 186 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

The Thin-Film Module as a High-Performance Semiconductor Package

Chung-Wen Ho, D. A. Chance, C. H. Bajorek et al. · IBM Journal of Research and Development · 1982 · 159 citations

Engineering, Computer Engineering, Electrical Engineering +17

IDDQ and AC scan: the war against unmodelled defects

P.C. Maxwell, Robert Aitken, K.R. Kollitz et al. · 2002 · 145 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 142

Authors

509

WM
W. Maly
Carnegie Mellon University, United States
4 publications · 195 citations
4
h-index
CH
C.F. Hawkins
University of New Mexico, United States
4 publications · 129 citations
4
h-index
RB
R.D. Blanton
Carnegie Mellon University, United States
4 publications · 130 citations
4
h-index
AT
Aaron Thean
IMEC, Belgium
3 publications · 104 citations
3
h-index
FH
Friedrich Hapke
Siemens (Hungary), Hungary
3 publications · 163 citations
3
h-index

1–5 of 509

Institutions

189

1–8 of 189

Venues

Microelectronics Reliability
5 publications · 75 citations
5
h-index
IEEE Transactions on Semiconductor Manufacturing
3 publications · 54 citations
3
h-index
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
3 publications · 62 citations
3
h-index
IEEE Design & Test of Computers
3 publications · 69 citations
3
h-index
Proceedings - International Symposium for Testing and Failure Analysis
3 publications · 116 citations
3
h-index

1–5