Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options

Characterization of soft errors caused by single event upsets in CMOS processes

Tanay Karnik, P. Hazucha · IEEE Transactions on Dependable and Secure Computing · 2004 · 535 citations

Engineering, Vlsi Design, Computer Architecture +22

Soft errors in advanced semiconductor devices-part I: the three radiation sources

R. Baumann · IEEE Transactions on Device and Materials Reliability · 2001 · 400 citations

Semiconductor Devices, Electrical Engineering, Radiation Sources +14

The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

R. Baumann · 2003 · 314 citations

Engineering, Vlsi Design, Logic Scaling Trends +22

Critical charge calculations for a bipolar SRAM array

L. B. Freeman · IBM Journal of Research and Development · 1996 · 149 citations

Electrical Engineering, Engineering, Physics +14

Collection of charge from alpha-particle tracks in silicon devices

Chang-Ming Hsieh, P. C. Murley, R. R. O’Brien · IEEE Transactions on Electron Devices · 1983 · 132 citations

Device Modeling, Electrical Engineering, Semiconductor Device +15