Tino Heijmen

Factors That Impact the Critical Charge of Memory Elements

Tino Heijmen, D. Giot, P. Roche · 2006 · 129 citations

Device Modeling, Transistor Model Parameters, Electrical Engineering +15

A Comprehensive Study on the Soft-Error Rate of Flip-Flops From 90-nm Production Libraries

Tino Heijmen, Philippe Roche, Gilles Gasiot et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 68 citations

Flip-flops From 90-Nm, Engineering, Vlsi Design +22

Analytical semi-empirical model for SER sensitivity estimation of deep-submicron CMOS circuits

Tino Heijmen · 2005 · 46 citations

Engineering, Vlsi Design, Ser Sensitivity Estimation +16

Soft-Error Rate Testing of Deep-Submicron Integrated Circuits

Tino Heijmen, André Nieuwland · 2006 · 35 citations

Engineering, Mem Testing, Verification +19

Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options

Tino Heijmen, B. Kruseman · Solid-State Electronics · 2005 · 27 citations

Embedded Srams, Non-volatile Memory, Electrical Engineering +6