Static Random Access Memory Modeling

Static Random Access Memory Modeling is a computational framework that formally characterizes the structure, behavior, and performance of static random access memory systems through deterministic state transitions and bistable feedback mechanisms inherent to semiconductor latch-based storage elements.

Publications

Citations

308

Authors

110

Institutions

Publications per year

2017–2026

Parents

Memory Modeling

Publications

A realistic fault model and test algorithms for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 237 citations

Engineering, Computer Engineering, Electrical Engineering +16

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti, Matteo Cecchetto, Jialei Wang et al. · 2020 · 221 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +15

Fault modeling and test algorithm development for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · 2003 · 183 citations

Engineering, Computer Engineering, Electrical Engineering +17

Statistical Blockade: Very Fast Statistical Simulation and Modeling of Rare Circuit Events and Its Application to Memory Design

Amith Singhee, Rob A. Rutenbar · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2009 · 159 citations

Engineering, Computer Engineering, Electrical Engineering +14

March SS: a test for all static simple RAM faults

Said Hamdioui, A.J. van de Goor, M. Rodgers · 2003 · 134 citations

Engineering, Computer Engineering, Computer Science +15

1–5 of 64

Authors

308

LW
L. W. Massengill
Vanderbilt University, United States
5 publications · 294 citations
5
h-index
RD
Ronald D. Schrimpf
Vanderbilt University, United States
5 publications · 271 citations
5
h-index
RA
Robert A. Reed
Vanderbilt University, United States
4 publications · 196 citations
4
h-index
BD
Brian D. Sierawski
Vanderbilt University, United States
4 publications · 188 citations
4
h-index
GH
G. Hubert
Office National d'Études et de Recherches Aérospatiales, France
4 publications · 175 citations
4
h-index

1–5 of 308

Institutions

110

1–8 of 110

Venues

IEEE Transactions on Nuclear Science
19 publications · 827 citations
16
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
4 publications · 213 citations
4
h-index
IEEE Transactions on Electron Devices
4 publications · 110 citations
4
h-index
Solid-State Electronics
3 publications · 57 citations
3
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2 publications · 396 citations
2
h-index

1–5