IEEE Transactions on Electron Devices · 2008 · 31 citations · 28 references
EngineeringComputer EngineeringElectrical EngineeringLow-power DesignMicroelectronicsVlsi DesignCmos Circuit DesignDevice ScalingLeakage Power ReductionPower ManagementPower OptimizationVoltage ScalingCmos ScalingDevice OptimizationLow-power Cmos DesignMemory Circuit DesignScaling Effects In CmosStatic Random-access MemoryStatic Random-access Memory DesignTechnology Scaling
As CMOS technology scaling is advancing beyond 100 nm, it has become increasingly difficult to meet the power and performance goals for various product applications while achieving aggressive area scaling in static random access memory (SRAM) development. This paper addresses many of the most pressing challenges in today's SRAM design from perspectives of both process technology optimization and design innovation. Key process tradeoff and optimization along with the advanced circuit design techniques for power management and low-voltage operation are discussed.
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Cramming More Components Onto Integrated Circuits
Gordon E. Moore · Proceedings of the IEEE · 1998 · 5.8K citations
Scaling, power, and the future of CMOS
Mark Horowitz, E. Alon, Dinesh Patil et al. · 2006 · 282 citations
Engineering, Computer Engineering, Electrical Engineering +17